Moulded body design ensure array of pins do not run during high speed testing. Kelvin & Non-Kelvin testing, high current, high voltage testing, our design are always work!

Integrated circuit test pins IC test contactor

Offset DIP type design with 2x tie bar

DIP type with tie bar inside

Aseco test pins
Tesec Test contactor pins

Fine pitch package design

Test pins with Kapton tape 

Copyright © 2007 Kajika Pte Ltd FALA Liquid Bag Filter

EPE Hydraulic Filters

Semiconductors Test pins 

Integrated Circuit testing

 

KAJIKA CORPORATION  

  •  Liquid Bag Filter, Cartridge Filter, Hydraulic Filter
  • Semiconductor and Integrated Circuits Test Devices